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Citation: Gajendra K Rinayat *, Bhavesh S Likhar, Viraj S Giri, Ritik G Gaidhane, Tanuj P Bakde, Amit R Bhende,Gajendra K Rinayat , Bhavesh S Likhar, Viraj S Giri, Ritik G Gaidhane, Tanuj P Bakde, Amit R Bhende ( 2024), Machine Fault Detection Using Condition Monitoring Techniques: A Review. International Journal of Innovations in Engineering and Science, 9(8): 1-8
Received: -; Accepted: -;
Published: 12/11/2026
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Copyright: 12181406072024_ICTIA-4.O--2024--Students-Journal-paper-(Responses).xlsx.
*Correspondence: Gajendra K Rinayat , Bhavesh S Likhar, Viraj S Giri, Ritik G Gaidhane, Tanuj P Bakde, Amit R Bhende, journalijies@gmail.com
